updated at 14 September
|TL - NANOCHARACTERIZATION AT A GLANCE|
Nanotechnology is largely based on the peculiar features of nanomaterial, which can be considered as an intermediate state between bulk materials and atoms. In the proper size range in fact, the material properties become dependent on morphological parameters, like dimension, aspect ratio, surface structure and so on. On the other hand, also the material structure often reflects the small size of nano-particles.
In order to master the peculiar features of a nanomaterial, the knowledge of the local structure and of the local functional properties are of mandatory importance, considering that the material development proceeds generally through the classical iteration among synthesis process, structural characterization and functionality under the supervision of structural and functional numerical simulation.
These short pre-conference tutorials want to introduce the audience to the basic principles underlying three investigation methods able to provide information at the atomic level, like electron microscopy, X-Ray diffraction and scanning probe microscopy. Moreover, the basics of the three dimensional reconstruction by computerized tomography will be illustrated.
The four lectures address an audience composed by young researchers, doctorate students and whichever person interested in a basic description of the investigation methods.
|09:00 - 10:40
|TL.A.1||Marco VITTORI ANTISARI, Nanoitaly association
Introduction to Transmission Electron Microscopy
|TL.A.2||Leander TAPFER, ENEA
Introduction to X-Ray based Methods
|10:40 - 11:00 Coffee Break|
|11:00 - 12:40
|TL.B.1||Daniele PASSERI, Sapienza Universiity of Rome
Introduction to Scanning Probe Microscopies
|TL.B.2||Matteo FERRONI, Brescia University
Introduction to Tomography