TT.VII.A

11:00 - 12:30

Microscopy techniques for industrial needs 1
In collaboration with: LFoundry
SYNOPSIS
TT.VII.A.1 WS.I.10.1	Simona BONINELLI CV CNR IMM, Catania Defects, activation and morphological modification by out of equilibrium processes in Si and Ge-based materials
TT.VII.A.2 WS.I.10.2	Domenico MELLO CV STMicroelectronics New Approach in TEM-EDS Quantitative Analysis, Used for Auger Calibration in Order to Set an Advanced Back Metal Control
TT.VII.A.3 WS.I.10.3	Andrea PARISINI CV CNR IMM, Bologna Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis methods for Application to Silicon Oxycarbides Thin Films
TT.VII.A.4 WS.I.10.4	Massimo VIGHI CV ENI Versalis, Mantova Repetita iuvant… Polymer Microscopy
TT.VII.A.5 WS.I.10.5	Francesco ROSSELLA CV Scuola Normale Superiore/NEST, Pisa Electroluminescence and crystal phases in hybrid metal-GaAs nanowire devices
Chair: Onofrio Antonino CACIOPPO, LFoundry
The symposium is part of the workshop WS.I on "Advanced Characterization Techniques for Nanotechnologies and Nanosciences"