TT.IV.B

11:00 - 12:30

Advanced SPM techniques: methods and applications 1
In collaboration with: LFoundry
SYNOPSIS
TT.IV.B.1 WS.III.2.1	Livia ANGELONI University of Delf, Delft, The Netherlands Use of Scanning Capacitance Microscopy as a tool for detecting damage to Lightly Doped Drain (LDD) implants in SRAM
TT.IV.B.2 WS.III.2.2	Stefano VERONESI CV CNR, Istituto Nanoscienze, Pisa An atomically flat gold film thermometer on mica to study energy (heat) exchange at the nano-scale
TT.IV.B.3 WS.III.2.3	Francesco MARINELLO University of Padua, Italy NSOM limits and potential in nano-optical characterization
TT.IV.B.4 WS.III.2.4	Cristiano ALBONETTI CV CNR-ISMN, Bologna The growth of organic ultra-thin films on silicon oxides with variable vacancy states: a Scanning Force Microscopy approach
Chair: Marco RENZELLI CV, LFoundry
The symposium is part of the workshop WS.III on "Advanced Scanning Probe Microscopies"