Friday, 12 July 2024

TS.II.C

11:30 - 13:00

Nano-characterization
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TS.II.C.1 Arianna LUCIA, CNIS Sapienza Università di Roma and Giuseppe MOCCIA, LFoundry
TERS applications to silicon strain characterization
TS.II.C.2 Giuseppe MOCCIA and Vanda GRANATO, LFoundry
Polysilicon  characterization  by Raman/XRD/TEM techniques
TS.II.C.3 Vanda GRANATO, LFoundry
Si e Si/Ge strain analysis by precesssion electron diffraction (PED)
TS.II.C.4 Antonio D’ORECCHIA, CNIS Sapienza Università di Roma - Mattia SILVESTRE, LFoundry
Electrical Characterizations through a Nanoprobing System Installed in a FESEM
TS.II.C.5 Arianna LUCIA, CNIS Sapienza Università di Roma - G. MARGUTTI, LFoundry
Micro and nano Raman characterization of SiGe structures obtained by Ge implant in Si

 

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