Sunday, 18 April 2021

TS.IV.B

17:15 - 18:45

Advances in mechanical and strain analysis at the nanoscale
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TS.IV.B.1 Edoardo BEMPORAD, Dept. of Engineering, University "Roma Tre"
Focused ion beam methods for micro-scale residual stress assessment in thin films
TS.IV.B.2 Athanassios GALANIS, NanoMegas
Nanomaterials Orientation and Strain Analysis at 1 nm scale using Precession Electron Diffraction techniques in TEM
TS.IV.B.3 Antonio RINALDI, ENEA
SEM-monitored nanoindentation helps understanding blistering in Cu2ZnSnS4 (CZTS) thin films casued by residual stresses
TS.IV.B.4 Marco Di Donato, Anton Paar, Switzerland
Optimized Design of Surface Mechanical Testing Procedures
TS.IV.B.5 Ennio CAPRIA, Nanoelec Advanced Characterisation Platform - Grenoble European Synchrotron (ESRF)
Structural characetrization of nano-electronic devices based on neutrons and synchrotron X-rays

 

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