Spectroscopic characterization and imaging
Coupling the spectral analysis carrying chemical and structural information with imaging techniques represents a method at the frontier of the nanostructure investigation. Both the interaction of X-Rays and fast electron with matter can collect information on the chemical structure of samples analysed in the proper mode. The two methods are often complementary and generally require high level dedicated instrumentation. The available information and some recent advancement in the connected instrumentation will be addressed in the present session.