Best practices on the use of EU funding for innovation on nanomaterials: the cases of MULTY2HYCAT and NanoMEMC²

28 September 2017,  11:00 - 13:00  NanoInnovation 2017

Facoltà d’Ingegneria Civile e Industriale, Università Roma La Sapienza
Via Eudossiana, 18 Roma

The event is free of charge prior registration on the website www.nanoinnovation.eu.
Pre-registration requested before 26 September 2017 (please let us know if you cannot attend after registering – Thank you). For general enquiries and to book your one-to-one meeting, please contact: Marina Dora Tavano This email address is being protected from spambots. You need JavaScript enabled to view it.

The workshop is organised by CiaoTech / PNO Group, the largest grants and innovation consultancy firm in Europe, with the aim of illustrating how EU funding could be successfully exploited to implement your Research & Innovation projects. The case studies presented are MULTY2HYCAT and NanoMEMC², two projects recently funded by the European Commission in the framework of the Horizon 2020 Programme.

MULTY2HYCAT’s goal is to design, obtain proof of concept, upscale and obtain industrial validation in a pre-pilot reactor of a new class of hierarchically-porous organic-inorganic hybrid materials to be used as active catalysts in multi-step asymmetric catalytic processes in specialty chemicals and pharma applications.

NanoMEMC² aims at developing new nanomaterials-based membranes to reduce the cost, energy and process limitations which currently make pre and post-combustion CO2 capture processes non-viable in many industrial applications, such as petrol refining and cement plants.

At the end of presentations, CiaoTech / PNO Group consultants are at your disposal for one-to one meeting (10 minutes) to analyse your project idea to be financed by EU funding.

Programme

These projects have received funding from the European Union's Horizon 2020 Research and Innovation program under Grant Agreement n° 720783 (MULTI2HYCAT) and under Grant Agreement n° 727734 (NanoMEMC²)

Desktop Scanning Electron Microscopes by Phenom-World

The serious alternative to floor model SEMs

28 September 2017,  09:00 - 12:30

Faculty of Civil and Industrial Engineering
Sapienza University of Rome

ABSTRACT

Scanning Electron Microscopy SEM is an essential tool to develop and study new materials or control their final properties and quality.

The workshop will get a deeper insight on desktop SEMs, nowadays able to reach the high quality standards of floor model SEMs providing unmatched ease-of-use and productivity.

A large part of the workshop will be dedicated to applicative examples both from Material science and Life science, to illustrate the ability of this technique to provide high quality images of sample structures and determine their elemental composition by Elemental Identification (EID).

Best-in-class imaging and analysis ProX Generation 5 Desktop SEM from Phenom-World will be presented on site during a live demonstration.

PROGRAMME

SPEAKER INFORMATION:

Fabio De Simone - Alfatest srl – Distributore esclusivo Phenom-World per l’Italia

Dr. Fabio De Simone is graduated in Agro-Industrial Biotecnology at University of Verona. He works for Alfatest since 2010, focusing from the beginning on material characterization instrumentation. He's Product Manager for PhenomWorld tabletop SEM product line.

Advances in Atomic Force Microscopy – Seminar and Life Demo

27 – 28 September 2017, 14:00 – 15:30

Faculty of Civil and Industrial Engineering
Sapienza University of Rome

ABSTRACT

SPM core & ancillary technology for advanced research

Atomic Force Microscopy (AFM) has been widely used to measure and characterize the surface of a sample in the nanometer scale.  One of the latest advancements in AFM industry has been the elimination of this cross-talk in the XY scan.  Here, the XY flexure scanner, driving a sample, is decoupled from the Z scanner to which a probe is attached.  The new AFM platform has a highly orthogonal and ultra flat scan. These key attributes of the new AFM are central to the accurate and reproducible measurements for quantitative nanoscale metrology.  Building upon the strength of the crosstalk eliminated platform, the new AFM adds the remarkable capability of non-contact AFM in ambient atmosphere by adopting a high speed Z scanner actuated by dedicated high force piezostacks. The non-contact mode preserves the sharp tip and, therefore, provides highly accurate and repeatable measurements of the sample geometry through tip de-convolution and quantitative measurement.

To improve the quantitative measurement, we developed self-optimizing algorithms for the scan parameters of the non-contact mode, such as servo gain, set-point, and scan speed by analyzing the tip-sample interaction force and the scan data of previous line. In the new Atomic Force Microscope (AFM) system, the user only needs to set the scan area and the z servo error limit that corresponds to the degree of image quality while minimizing human skill factors.

The new improved SPM not only produced accurate images faster, but also allowed various new industrial applications for HDD and semiconductor industry as well as basic research applications. Eventually, SPM will become as easy and widely adopted as optical microscope.

PROGRAMME

SPEAKER INFORMATION:

Victor Bergmann – Application Scientist at Park Systems