Milano Bicocca 

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TESCAN AssingGroup


Recent Trends in Scanning Electron Microscopy

27 September 2017: 09.30 - 12.30



TESCAN is one of the global suppliers of scientific instruments. The company is building its reputation in the field of designing and manufacturing scanning electron microscopes and system solutions for different applications.

In the workshop, we will introduce TESCAN products and explain the key technologies that are behind the stunning success of TESCAN electron microscopes and focus ion beam systems and the rapid growth of the company. We will also present our Dual Beam technology: Types and unique solutions in FIB-SEMs; large and small TEM lamella preparation and 3D EDX and EBSD analysis; progress in applications with TESCAN integrated compact TOF-SIMS analyzer.


09.30 Welcome
09.35 Introduction of TESCAN and Product Line
Massimo DEL MARRO, Sales Director and Vice President of Assing S.p.A, TESCAN representative in Italy

10.30 Coffee Break
11.00 Overview of Applications with TESCAN FIB-SEMs in Material, Semiconductors and Life Sciences
Petr KLÍMEK, Application Scientist at TESCAN ORSAY HOLDING, a.s.

12.00 Discussion
12.30 Conclusion and Light Lunch


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Dr Massimo Del Marro He is graduated in Biology at La Sapienza University, Rome, in 1978.
He has been working with Assing since 1980, where he currently holds the position of Sales Director.
He held workshops and seminars on electron microscopy in the Italian Universities and published several scientific papers.

Petr Klímek, Ph.D.

Petr Klimek

Working Experience:

  • Sep 2016 – current position [Sep 2017]: TESCAN ORSAY HOLDING, a.s Application Specialist, Material science Brno, Czech Republic
  • Oct 2015 – Jun 2016 Oregon State University Visiting Scientist, Material science Corvallis, Oregon
  • Jul 2013 – Oct 2015 Mendel University in Brno Junior Scientist, Material science Brno, Czech Republic


  • Jul 2013 – [Sep 2016] Mendel University in Brno Doctoral´s degree, Material science Brno, Czech Republic
  • Jun 2011 – Jul 2013 Mendel University in Brno Master´s degree, Wood engineering Brno, Czech Republic
  • Aug 2010 – Feb 2011 Kaunas University of Technology Agreement, Wood engineering Kaunas, Lithuania
  • Sep 2008 – Jun 2011 Mendel University in Brno Bachelor's degree, Wood technology Brno, Czech Republic





connecting    multi2hycat    nanomemc


Best practices on the use of EU funding for innovation on nanomaterials: the cases of MULTY2HYCAT and NanoMEMC2

28 September 2017,  11:00 - 13:00  NanoInnovation 2017

Facoltà d’Ingegneria Civile e Industriale, Università Roma La Sapienza
Via Eudossiana, 18 Roma

The event is free of charge prior registration on the website
Pre-registration requested before 26 September 2017 (please let us know if you cannot attend after registering – Thank you). For general enquiries and to book your one-to-one meeting, please contact: Marina Dora Tavano
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The workshop is organised by CiaoTech / PNO Group, the largest grants and innovation consultancy firm in Europe, with the aim of illustrating how EU funding could be successfully exploited to implement your Research & Innovation projects. The case studies presented are MULTY2HYCAT and NanoMEMC2, two projects recently funded by the European Commission in the framework of the Horizon 2020 Programme.

MULTY2HYCAT’s goal is to design, obtain proof of concept, upscale and obtain industrial validation in a pre-pilot reactor of a new class of hierarchically-porous organic-inorganic hybrid materials to be used as active catalysts in multi-step asymmetric catalytic processes in specialty chemicals and pharma applications.

NanoMEMC2 aims at developing new nanomaterials-based membranes to reduce the cost, energy and process limitations which currently make pre and post-combustion CO2 capture processes non-viable in many industrial applications, such as petrol refining and cement plants.

At the end of presentations, CiaoTech / PNO Group consultants are at your disposal for one-to one meeting (10 minutes) to analyse your project idea to be financed by EU funding.


11.00 - 11.20 Welcome and introduction
Andrea Rausa, Senior Innovation Manager CiaoTech / PNO Group
11.20 - 11.40 MULTI2HYCAT Project: MULTI-site organic-inorganic HYbrid CATalysts for MULTI-step chemical process
Prof. Enrica Gianotti, University of Eastern Piedmont - Amedeo Avogadro

11.40 - 12.00 NanoMEMC2 Project: NanoMaterials Enhanced Membranes for Carbon Capture
Prof. Marco Giacinti Baschetti, University of Bologna

12.00 - 12.20 The valorization of results in NMBP projects
Ada della Pia, Junior Innovation Consultant CiaoTech / PNO Group

12.20 - 13.00 Q&A and one-to-one meeting with CiaoTech / PNO Group consultants

EU These projects have received funding from the European Union's Horizon 2020 Research and Innovation program under Grant Agreement n° 720783 (MULTI2HYCAT) and under Grant Agreement n° 727734 (NanoMEMC2)




 Alfatest  Phenomworld


Desktop Scanning Electron Microscopes by Phenom-World

The serious alternative to floor model SEMs

28 September 2017,  09:00 - 12:30

Faculty of Civil and Industrial Engineering
Sapienza University of Rome

 Alfa fig 01  Alfa fig 02



Scanning Electron Microscopy SEM is an essential tool to develop and study new materials or control their final properties and quality.

The workshop will get a deeper insight on desktop SEMs, nowadays able to reach the high quality standards of floor model SEMs providing unmatched ease-of-use and productivity.

A large part of the workshop will be dedicated to applicative examples both from Material science and Life science, to illustrate the ability of this technique to provide high quality images of sample structures and determine their elemental composition by Elemental Identification (EID).

Best-in-class imaging and analysis ProX Generation 5 Desktop SEM from Phenom-World will be presented on site during a live demonstration.


09.00 Registration
9.30 Phenom-World benchtop SEM as a serious alternative to floor model SEMs: unmatched ease-of-use, versatility and productivity

9.45 Overview of Phenom desktop SEM applications, including nanomaterials (nanosensors, nanofabrication, nanofibers, nanocomposites) and life science (nanomedicine, etc.)
10.00 Phenom ProX Generation 5 demo live
10.30 Coffee Break
11:00 Phenom-World benchtop SEM as a serious alternative to floor model SEMs: unmatched ease-of-use, versatility and productivity (replicate)

11.15 Overview of Phenom desktop SEM applications, including nanomaterials (nanosensors, nanofabrication, nanofibers, nanocomposites) and life science (replicate)
11.30 Phenom ProX Generation 5 demo live (replicate)
12.00 Discussion


Fabio De Simone - Alfatest srl – Distributore esclusivo Phenom-World per l’Italia

Dr. Fabio De Simone is graduated in Agro-Industrial Biotecnology at University of Verona. He works for Alfatest since 2010, focusing from the beginning on material characterization instrumentation. He's Product Manager for PhenomWorld tabletop SEM product line.


 LogoGambetti2 Park Logo


Advances in Atomic Force Microscopy – Seminar and Life Demo

27 – 28 September 2017, 14:00 – 15:30

Faculty of Civil and Industrial Engineering
Sapienza University of Rome

 gambetti 01  gambetti 02



SPM core & ancillary technology for advanced research

Atomic Force Microscopy (AFM) has been widely used to measure and characterize the surface of a sample in the nanometer scale.  One of the latest advancements in AFM industry has been the elimination of this cross-talk in the XY scan.  Here, the XY flexure scanner, driving a sample, is decoupled from the Z scanner to which a probe is attached.  The new AFM platform has a highly orthogonal and ultra flat scan. These key attributes of the new AFM are central to the accurate and reproducible measurements for quantitative nanoscale metrology.  Building upon the strength of the crosstalk eliminated platform, the new AFM adds the remarkable capability of non-contact AFM in ambient atmosphere by adopting a high speed Z scanner actuated by dedicated high force piezostacks. The non-contact mode preserves the sharp tip and, therefore, provides highly accurate and repeatable measurements of the sample geometry through tip de-convolution and quantitative measurement.

To improve the quantitative measurement, we developed self-optimizing algorithms for the scan parameters of the non-contact mode, such as servo gain, set-point, and scan speed by analyzing the tip-sample interaction force and the scan data of previous line. In the new Atomic Force Microscope (AFM) system, the user only needs to set the scan area and the z servo error limit that corresponds to the degree of image quality while minimizing human skill factors.

The new improved SPM not only produced accurate images faster, but also allowed various new industrial applications for HDD and semiconductor industry as well as basic research applications. Eventually, SPM will become as easy and widely adopted as optical microscope.


14.00 Welcome and Introduction
14.10 Talk: “SPM core & ancillary technology for advanced research“

14.40 Instrument Demonstration on Park NAX10 AFM
15.10 Discussion und Summary


Victor Bergmann – Application Scientist at Park Systems




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Technical Support


Organizing Secretariat

Dr. Cristina Gippa

+ 39 339 771 4107
+ 39 388 1785318

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All truths are easy to understand once they are discovered; the point is to discover them.

Galileo Galilei

Anything one man can imagine, other men can make real.

Jules Verne

Scientist investigate that which already is; engineers create that which has never been.

Theodore Von Karman

I am not discouraged, because every wrong attempt discarded is another step forward.

Thomas A. Edison